Stefano Concina

Stefano Concina has been involved in the semiconductor equipment industry for over twenty-five years in engineering and management positions. During his tenure at KLA-Tencor， he was the Vice President and General Manager of the E-Beam Metrology business unit， created after the acquisition of Metrologix in 1994. Most recently， he was the General Manager of the E-Beam Inspection business unit. In these positions he successfully managed the development of state-of-the-art electron beam systems and was responsible for the P&L. Prior to KLA-Tencor， he held a variety of positions at Schlumberger， from software engineer to Vice President of the Diagnostic Systems division， an electron and ion beam design debug and failure analysis business.

Stefano holds a diplome d’ingénieur from ESIEE， France and an MSEE from Caltech and has done graduate work at Stanford in the area of CAD for VLSI design optimization. He is named as a co-inventor in 6 patents on image processing and electron beam systems design.